Papers for
chip designers
Papers whose findings have a practical use for this group, as judged from the abstract. Open a paper to read what it means in practice.
Chip area and power cut with clever stacked transistor design
System-Technology Co-Evaluation of A7 CFET and A10 NSFET Technologies from Cell Parasitics to Chip Reliability
Abstract: Complementary FETs (CFETs) extend nanosheet FET (NSFET) scaling by vertically stacking n- and p-type gate-all-around (GAA) devices, thereby shrinking standard-cell area. The performance gain, however, cannot be assessed from device metrics alone, as CFET layouts also introduce larger cell-level parasitic resistance and capacitance (RC). In this work, we present a physics-based thermal- and aging-aware system-technology co-evaluation (STCO) flow to assess parasitic RCs in A7 CFET and A10 NSFET technology nodes. Our flow links calibrated device models, optimized standard-cell generation, automated GDS-to-TCAD conversion enabling accurate 3D parasitic RC extraction, full RTL-to-GDS implementation for an AI accelerator, multiphysics thermal analysis, and physics-based bias temperature instability (BTI) aging evaluation. Using the same device model for both technologies, we can isolate the impact of parasitic RCs and design at different levels of the design flow. The results of the AI accelerator design demonstrate that the A7 CFET reduces the chip area by 24.7% and the total wire length by 12%, improving the area efficiency TOPS/mm^2 by 74% relative to the baseline of the A10 NSFET. Under iso-frequency operation, results reveal that CFET voltage scaling reduces power by 68% and lowers power density from 148 W/cm^2 to 55 W/cm^2, which reduces the chip's temperature from 125 degrees C down to merely 62 degrees C. The resulting reduction in stress temperature suppresses 10-year BTI-induced degradation by 39%, reducing the required aging timing guardband by 53%.
NeuroFlex boosts deep learning speed and energy use by mixing modes
NeuroFlex: Lossless Element-Level ANN-SNN Co-Execution for Efficient Sparse Inference
Abstract: Sparse DNN accelerators specialize in ANN or SNN execution, leaving energy or latency on the table when workload characteristics vary within a layer. Hybrid accelerator designs that switch modes at layer or tile granularity suffer from low PE utilization since one core type idles whenever the other is active. NeuroFlex is the first accelerator to assign every output element independently to ANN or SNN execution mode with zero accuracy loss. We extend integer-exact ANN-SNN equivalence from layers to individual output elements, thereby enabling mode switching with no conversion error. An offline cost-guided scheduler scores each element by its marginal energy-delay trade-off and packs work across PEs, achieving 97-99% PE utilization compared to 40-45% for layer-wise hybrids. NeuroFlex reduces EDP by 57-67% over a strong ANN-only baseline and delivers up to 2.5x speedup over a dual-sparse SNN-only baseline. Our cost-guided scheduler improves throughput by 16-19% over random element assignment across vision, language, and transformer workloads.
Two-transistor one-rram chip enables more reliable in-memory computing
OTTER - Two Transistor - One RRAM Architecture for Reliable In-Memory-Computing in 28 nm CMOS Technology
Abstract: This work presents OTTER, a 28 nm CMOS platform co-integrated with TaOx-based valence-change mechanism (VCM) RRAM, demonstrating a two-transistor-one-memristive-device (2T1R) architecture for reliable in-memory computing. The 2T1R cell combines a low-drive-current (LD) transistor and a high-drive-current (HD) transistor in parallel, providing dedicated bias paths for SET programming and RESET operation, respectively. Through systematic experimental and simulated comparison of various transistor-pairing configurations using the physical compact model JART VCM Rth, design guidelines for transistor sizing are derived, establishing the minimum RESET transistor W/L required for complete RESET as a function of the SET current compliance. The 2T1R cell is further characterized under pulse-based programming, demonstrating multilevel analog conductance tuning with narrow, well separated conductance states across six programmable levels. An analog content-addressable memory (aCAM) design based on the same 2T1R cell is additionally analyzed at the circuit level, evaluating trade-offs between top- and bottom-connected RRAM comparator configurations. A hardware implementation of compute-in-memory (CIM) multiply-and-accumulate (MAC) operations is further demonstrated on a 15 x 15 2T1R crossbar array.