machine learning system integrators

Abstract: Wave-based processors promise fast, energy-efficient Fourier layers for neural operators. They are usually validated on randomly sampled devices, but using them requires knowing how large their error can become under fabrication and alignment variation. In a stylised numerical case study, a hybrid Fourier neural operator runs its four spectral layers on simulated coherent 4f processors with 32 toleranced knobs, whose half-widths are representative rather than calibrated. For 120 models (four tasks, six training methods, five seeds), we compared the worst of N random in-spec devices with a searched one. On a deterministic simulator with one frozen draw of the random static errors, the searched device's held-out error was 1.08-3.10 times the maximum over 200 Monte Carlo devices and 1.06-2.71 times that over 1000. With 20 fresh static draws, it still exceeded the maximum over 200 random devices in 116 of 120 models. Under uniform sampling, the probability of drawing such a device is at most 0.37% per model (two-sided 95% Clopper-Pearson), which says nothing about how large its error is. The gap persisted with uniform or Sobol' sampling at the search's budget, shared knobs, a second crosstalk model, box scales of 0.25-2 and a pixel-level device model. Models trained only with random static errors reached 3.7-39.9 times their nominal error on searched devices, and fine-tuning on random and gradient-searched devices gave the lowest searched error of the six in all 20 task-seed pairs. For two heat-exchanger quantities, a search targeted at each exceeded the worst of 1000 random devices in all 39 models, and hence the Wilks 95/95 limit (worst of 59). For the mean pressure of 11 models, no random device exceeded a 1% error threshold, but the searched device did. Random testing estimates how often errors exceed a threshold; worst-device search gives a lower bound on how large they can be.

Abstract: Test-Time Training (TTT) adapts models to incoming test samples (e.g. out-of-distribution, (OOD)) when conventional fine-tuning is infeasible. Existing TTT methods for Vision-Language Models (VLMs) create supervision from several augmented views, each requiring forward (and often backward) passes through the entire VLM, incurring substantial computational cost. We observe that one forward pass with all the intermediate layer outputs already yields far more signal than the final embedding from all augmentations. We introduce Layer Query Network (LQN), a lightweight approach that can adapt a frozen VLM (teacher) in a single forward pass of the VLM via a small model (student). LQN uses Position-Aware Distillation (PAD) to mimic the teacher VLM's intermediate-layer spatial tokens by querying spatial coordinates of intermediate tokens. LQN additionally relies on Location Consistency Regularization (LCR), a self-supervision technique, replacing expensive O(H x W) image augmentation with O(1) coordinate sampling. Integrating these, LQN i) adapts and improves zero-shot CLIP ViT-B/16 by 9.8% Top-1 on OOD ImageNet, ii) outperforms the previous best GS-Bias on fine-grained classification by 3.9% Top-1, iii) achieves faster convergence than TPS for CLIP ResNet-50 (47 mins vs 55 mins), iv) generalizes adaptation to VLMs like SigLIP, EVA-CLIP, and CoCa, and lightweight students like MLP, ResNet, VGG, and v) extends to panoptic, instance, and semantic segmentation.

Abstract: Analog compute-in-memory (CIM) enables energy-efficient model acceleration, but its reliance on ADC-based readout, which directly quantizes noisy column currents, makes inference accuracy highly sensitive to analog read noise, active-row scaling, and ADC precision. In this paper, we present NOVA-CIM, a noise- and correlation-tolerant stochastic interface for analog CIM by replacing multi-bit ADC readout with random-reference 1-bit sensing and reconstructing results through lightweight counting. By converting column currents into comparison probabilities, this probability-domain readout averages zero-mean dynamic read noise over stochastic samples while reducing dependence on high-resolution ADCs. We provide a unified robustness analysis showing that dynamic read noise is suppressed through temporal averaging and that spatial input-bitstream correlation increases instantaneous current variance rather than introducing first-order MAC bias. MAC-level experiments and end-to-end evaluation on ViT-Base validate the analysis: under read noise, Top-1 accuracy remains 84.48% near the 84.51% bfloat16 (BF16) baseline; under stochastic number generator (SNG) reuse, MAC bias stays near zero while root-mean-square error (RMSE) and stochastic cross-correlation (SCC) grow as predicted.